Advanced methods in surface characterization Syllabus

HomeSyllabus Lectures Readings
  1. AES, SAM
  2. XPS,UPS
  3. ARPS
  4. LEIS, HEIS, ISS, RBS, SIMS
  5. Depth profiling
  6. SEM, FIM, FEM, STM
  7. LEED, RHEED
  8. EXAFS, SEXAFS, SERS, EELS
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