Advanced Characterization Techniques Syllabus

Home Syllabus Lectures Readings
  1. Introduction to Scanning Probe Microscopy (SPM)
  2. Introduction to STM
  3. Advanced SPMs
  4. Electrostatic Force Method (EFM)
  5. Magnetic Force Method (MFM)
  6. Scanning Thermal Method (SthM)
  7. Piezoelectric Force Method (PFM)
  8. High Resolution Electron Microscope (HRTEM), Focused Ion Beam (FIB)
  9. Characterization equipment in molecular scale
  10. Material Characterization in nano scale
  11. X-Ray and Photon Diffraction Techniques
  12. Scanning electron microscope
  13. Analytical Electron Microscopy
  14. EDX, EELS
  15. Surface analysis techniques
  16. XPS, SIMS, Auge
  17. Micro-scale physical properties analysis techniques
  18. Atomic Structure Analysis
  19. Clean Room
  20. Electron Beam Lithography
  21. Dry/Wet Etching
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